On the atomistic details of electromigration-induced drift
(2004) Scripta Materialia — Vol. 50, n° 2, p. 267-271 (2004)
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Proost, J., D’Haen, J., Jin, M., & Verlinden, B. (2004). On the atomistic details of electromigration-induced drift. Scripta Materialia, 50(2), 267-271. https://doi.org/10.1016/j.scriptamat.2003.10.005 (Original work published 2004)