Measuring the Michel parameter xi'' in polarized muon decay

Morelle, X.;Danneberg, N.;Egger, J.;Fetscher, W.;Prieels, René;et.al.
(2000) arXiv —

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  • Morelle, X.
    Author
  • Danneberg, N.
    Author
  • Egger, J.
    Author
  • Fetscher, W.
    Author
  • Deutsch, JulesUCLouvain
    Author
  • Govaerts, Janorcid-logoUCLouvain
    Author
  • Ninane, AlainUCLouvain
    Author
  • Prieels, RenéUCLouvain
    Author
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Morelle, X., Danneberg, N., Egger, J., Fetscher, W., Foroughi, F., Hilbes, C., Kirch, K., Knowles, P., Kohler, K., Kozela, A., Lang, J., Liu, Y. W., Medve, R., Naviliat, O., Van Hove, P., Deutsch, J., Govaerts, J., Ninane, A., & Prieels, R. (2000). Measuring the Michel parameter xi″ in polarized muon decay. arXiv. https://hdl.handle.net/2078.5/257275