Advanced TEM analysis of deformation and growth twins in coarse and nano-grained materials
(2011) The XIVth International Conference on Electron Microscopy — Location: Wisla, Poland (26.June.2011)
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Pardoen, T., Jacques, P. J., Schryvers, D., Idrissi, H., Wang B., Colla M.-S., Renard K., & Raskin, J.-P. (2011). Advanced TEM analysis of deformation and growth twins in coarse and nano-grained materials. The XIVth International Conference on Electron Microscopy, Wisla, Poland. https://hdl.handle.net/2078.5/227544