Back-Gate Lumped Resistance Effect on AC Characteristics of FD-SOI MOSFET
(2022) IEEE Microwave and Wireless Components Letters — Vol. 32, n° 6, p. 704-707 (2022)
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Vanbrabant, M., Nyssens, L., Kilchytska, V., & Raskin, J.-P. (2022). Back-Gate Lumped Resistance Effect on AC Characteristics of FD-SOI MOSFET. IEEE Microwave and Wireless Components Letters, 32(6), 704-707. https://doi.org/10.1109/lmwc.2022.3162497 (Original work published 2022)