In-situ monitoring of surface reactions using high-resolution curvature measurements: application to Ti anodising

Vanhumbeeck, Jean-François;Proost, Joris
(2007) 58th Meeting of the International Society of Electrochemistry — Location: Banff, Canada (2007)

Files

No attached file found for this publication.

Details

Authors
  • Vanhumbeeck, Jean-FrançoisUCLouvain
    Author
  • Proost, JorisUCLouvain
    Author
Affiliations

Citations

Vanhumbeeck, J.-F., & Proost, J. (2007). In-situ monitoring of surface reactions using high-resolution curvature measurements: application to Ti anodising. Proceedings, p. #533. https://hdl.handle.net/2078.5/231089