In-situ monitoring of surface reactions using high-resolution curvature measurements: application to Ti anodisingVanhumbeeck, Jean-François;Proost, Joris(2007) 58th Meeting of the International Society of Electrochemistry — Location: Banff, Canada (2007)
FilesNo attached file found for this publication.DetailsAuthorsVanhumbeeck, Jean-FrançoisUCLouvainAuthorProost, JorisUCLouvainAuthorAffiliationsUCLouvainFSA/MAPR - Département des sciences des matériaux et des procédésShow moreCitations APA Chicago FWB Vanhumbeeck, J.-F., & Proost, J. (2007). In-situ monitoring of surface reactions using high-resolution curvature measurements: application to Ti anodising. Proceedings, p. #533. https://hdl.handle.net/2078.5/231089