Relation between adhesion, microstructure and composition of thermally evaporated Al thin films on PET

Phuku, P; Bertrand, Patrick; De Puydt, Yves

doi:10.1002/sia.740160154

Relation between adhesion, microstructure and composition of thermally evaporated Al thin films on PET

Phuku, P

;

Bertrand, Patrick

;

De Puydt, Yves

(1990) Surface and Interface Analysis — Vol. 16, p. 248-249 (1990)

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Authors

Phuku, PUCLouvain
Author
Bertrand, PatrickUCLouvain
Author
De Puydt, YvesUCLouvain
Author

Affiliations

UCLouvainFSA/MAPR - Département des sciences des matériaux et des procédés

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Phuku, P., Bertrand, P., & De Puydt, Y. (1990). Relation between adhesion, microstructure and composition of thermally evaporated Al thin films on PET. Surface and Interface Analysis, 16, 248-249. https://doi.org/10.1002/sia.740160154 (Original work published 1990)