Control Charts and Efficient Sampling Methodologies in the Field of Photovoltaics
(2002) 29th IEEE photovoltaic specialists conference — Location: New Orleans (19.May.2002)
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- Authors
Govaerts, Bernadette 
- Abstract
- Industries must have their process under control in order to become more performant. This is true in particular for the photovoltaic (PV) industry. A Statistical Process Control (SPC) study has been realised for the semi-industrial process at IMEC. In these circumstances control charts have been built and sampling schemes have been investigated. It has been found to be powerful to detect special causes of variation and will still be used in the future for early detection of out of control situations.
- Affiliations
Citations
Allebe, C., Govaerts, B., Van Kerschaver, E., De Wolf, S., & Szlufcik, J. (2002). Control Charts and Efficient Sampling Methodologies in the Field of Photovoltaics. Photovoltaic Specialists Conference, 2002. Conference record of the 29 IEEE, p. 387-390. https://doi.org/10.1109/PVSC.2002.1190540