Modeling and measurements of high-temperature off-state currents in SOI MOSFETs

Rudenko, Tamara;Rudenko, A.;Kilchytska, Valeriya
(1997) 8th International Electrochemical Society meeting and Symposium on “Silicon-on-Insulator Technology and Devices” — Location: Paris (France) (31.August.1997)

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  • Rudenko, TamaraNational Academy of Sciences of Ukraine
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  • Rudenko, A.National Academy of Sciences of Ukraine
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  • Kilchytska, ValeriyaUCLouvain
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Rudenko, T., Rudenko, A., & Kilchytska, V. (1997). Modeling and measurements of high-temperature off-state currents in SOI MOSFETs. Proceedings of the 8th International Electrochemical Society meeting and Symposium on “Silicon-on-Insulator Technology and Devices”, 295-300. https://hdl.handle.net/2078.5/252807