Electrical properties of ZMR SOI structures: characterization techniques and experimental results

Rudenko, Tamara;Lysenko, V.S.;Nazarov, Alexei
(1994) Mikroelectronika — Vol. 23, n° 6, p. 32-38 (1994)

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  • Rudenko, TamaraLashkarov Institute of Semiconductor Physics, Ukraine
    Author
  • Lysenko, V.S.Lashkarov Institute of Semiconductor Physics, Ukraine
    Author
  • Nazarov, AlexeiNational Academy of Physics of Ukraine
    Author
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Rudenko, T., Lysenko, V. S., & Nazarov, A. (1994). Electrical properties of ZMR SOI structures: characterization techniques and experimental results. Mikroelectronika, 23(6), 32-38. https://hdl.handle.net/2078.5/252435 (Original work published 1994)