Electrical properties of ZMR SOI structures: characterization techniques and experimental resultsRudenko, Tamara;Lysenko, V.S.;Nazarov, Alexei(1994) Mikroelectronika — Vol. 23, n° 6, p. 32-38 (1994)
FilesNo attached file found for this publication.DetailsAuthorsRudenko, TamaraLashkarov Institute of Semiconductor Physics, UkraineAuthorLysenko, V.S.Lashkarov Institute of Semiconductor Physics, UkraineAuthorNazarov, AlexeiNational Academy of Physics of UkraineAuthorAffiliationsUCLouvainFSA/ELEC - Département d'électricitéShow moreCitations APA Chicago FWB Rudenko, T., Lysenko, V. S., & Nazarov, A. (1994). Electrical properties of ZMR SOI structures: characterization techniques and experimental results. Mikroelectronika, 23(6), 32-38. https://hdl.handle.net/2078.5/252435 (Original work published 1994)