ToF-SIMS molecular characterization and nano-SIMS imaging of submicron domain formation at the surface of PS/PMMA blend and copolymer thin films
(2004) Applied Surface Science — Vol. 231-2, p. 289-295 (2004)
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- Abstract
- Thin films of polystyrene (PS)/poly(methyl methacrylate) (PMMA) blends and block copolymers were characterized by two different SIMS instruments. ToF-SIMS was used to obtain the molecular composition of the upper most surface while nano-SIMS allowed us to visualize the surface morphology with submicrometer lateral resolution. The blends and copolymers showed different effects on annealing. ToF-SIMS spectra of annealed blends showed a decrease in the concentration of PS and an increase in the concentration of PMMA as compared to the pristine sample. By contrast, the spectra of annealed copolymers showed a decrease in the concentration of PMMA and an increase in the concentration of PS. The result obtained from the nano-SIMS imaging of the blends and copolymers revealed the formation of submicron domains at the surface on annealin. In case of blends, the images showed a strong oxygen signal on the surface suggesting a higher PMMA concentration, while for copolymers, the oxygen signal was quite low. ToF-SIMS spectra combined with nano-SIMS images help to interpret the surface topographical changes that the PS/PMMA blend and copolymer thin films undergo on annealing. (C) 2004 Elsevier B.V. All rights reserved.
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Citations
Kailas, L., Audinot, J., Migeon, H., & Bertrand, P. (2004). ToF-SIMS molecular characterization and nano-SIMS imaging of submicron domain formation at the surface of PS/PMMA blend and copolymer thin films. Applied Surface Science, 231-2, 289-295. https://doi.org/10.1016/j.apsusc.2004.03.063 (Original work published 2004)