Characterization and modeling of integrated inductors and alternative MOSFETs in SOI technology

Dehan, Morin;Raskin, Jean-Pierre;Vanhoenacker-Janvier, Danielle
(2002) Union Radio-Scientifique Internationale (U.R.S.I.) — Location: Brussels, Belgium (13.December.2002)

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Dehan, M., Raskin, J.-P., & Vanhoenacker-Janvier, D. (2002). Characterization and modeling of integrated inductors and alternative MOSFETs in SOI technology. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.), p. 3 pages. https://hdl.handle.net/2078.5/229367