Optical tomography based on phase-shifting schlieren deflectometry
(2010) Optical Sensing and Detection — Location: Brussels, Belgium (12.April.2010)
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- Abstract
- We present a new optical tomography technique based on phase-shifting schlieren deflectometry. The principle is that of computerized tomography. The three-dimensional profile is reconstructed from the deflection angles of rays passing through the tested object. We have investigated optical phantoms chosen in view of the characterization of dendritic growth in a solidification process. Promising results have been obtained with a homogeneous sphere and a bundle of 200 mu m fibers. The deviation angles exceed two degrees with a variation of the refractive index Delta n = 0.025.
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Foumouo, E., Dewandel, J.-L., Joannes, L., Beghuin, D., Jacques, L., & Antoine, P. (2010). Optical tomography based on phase-shifting schlieren deflectometry. Optical Sensing and Detection, Vol. 7726, 77260U (8 pp.). https://doi.org/10.1117/12.854063