On-wafer wideband characterization: from technology improvements to compact models for advanced MOS devices
(2006) Microwave Technology and Techniques Workshop Enabling Future Space Systems — Location: Noordwijk, The Netherlands (15.May.2006)
Files
No attached file found for this publication.
Details
- Authors
- Affiliations
Citations
Raskin, J.-P., Pailloncy, G., & Lederer, D. (2006). On-wafer wideband characterization: from technology improvements to compact models for advanced MOS devices. Proceedings of the Microwave Technology and Techniques Workshop Enabling Future Space Systems, p. 6 pages (paper 30). https://hdl.handle.net/2078.5/229524