Returns to scale on nonparametric deterministic technologies: Simplifying goodness-of-fit methods using operations on technologies
(2000) Journal of Productivity Analysis — Vol. 14, n° 3, p. 267-274 (2000)
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- Abstract
- The purpose of this short article is to simplify goodness-of-fit methods to obtain qualitative information about returns to scale for individual observations. Traditional and new goodness-of-fit methods developed for estimating returns to scale on nonparametric deterministic reference technologies are reviewed. Using composition rules for technologies with specific returns to scale assumptions, we show how these goodness-of-fit methods can be simplified in the case of convex technologies (Data Envelopment Analysis (DEA) models).
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Briec, W., Kerstens, K., Leleu, H., & Eeckaut, P. (2000). Returns to scale on nonparametric deterministic technologies: Simplifying goodness-of-fit methods using operations on technologies. Journal of Productivity Analysis, 14(3), 267-274. https://doi.org/10.1023/A:1026507205581 (Original work published 2000)