On the local estimation of strain based on SEM high‐resolution electron back‐scattered diffraction
(2019) RSMB 2019 - Annual meeting of the Royal Belgian Society for Microscopy — Location: Louvain-la-Neuve, Belgium (9.September.2019)
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Alkorta, J., Marteleur, M., & Jacques, P. (2019). On the local estimation of strain based on SEM high‐resolution electron back‐scattered diffraction. RSMB 2019 - Annual meeting of the Royal Belgian Society for Microscopy, Louvain-la-Neuve, Belgium. https://hdl.handle.net/2078.5/91808